Omega Optical necessary physical, environmental, and spectral attribute metrology tools to ensure compliance with our and your standards. We are certified and registered to the ISO 9001:2015 standard. We also actively support lean manufacturing practices, including Six Sigma methodologies and approaches to problem solving. We strongly believe that both practices contribute to a culture of continuous improvement.
Additional customized in-process and final inspection metrology tools and equipment have been manufactured and tailored to the unique needs of our manufacturing processes.
- Atomic force microscopy
- Optical microscopy
- FTIR spectrophotometry
- Advanced interferometric surface characterization
- Tactile surface measurements
- Single & dual beam spectrophotometers
- Custom grating spectrophotometers
- Diffraction Grating Efficiency Measurement
- Stray Light Measurement
- Integrated Blocking
- Accelerated Environmental Lifetime Testing
- Thermal cycling
- Humidity cycling
- Cosmetic inspection stations and reference standards
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Omega Optical has an ISO 9001:2015 certified Quality Management System.
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Additional Metrology/ Testing Capabilities
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Certifications and Compliance Statements
"Omega Optical is committed to meet all customer requirements and specifications, as well as to comply with all statutory and regulatory obligations, through continual improvement of its quality management system."
Filters are tested and evaluated throughout the manufacturing process. Spectrophotometers and optical measuring instruments are calibrated and maintained to meet the requirements of our Quality System.
Unless otherwise specified by the customer,
- Filter surface durability and quality is evaluated in accordance with MIL-C-48497A;
- Environmental durability for humidity is in accordance with MIL-STD-810,Method 507.3, Procedure 1, cycle 1;
- Temperature and solubility testing in accordance with MIL-PRF-13830B;
- Testing documentation and certification can be provided upon request;
- When applicable, we follow sampling procedures defined by MIL-STD-105E
- Standard optical testing includes measurement of %T, %R and/or OD in the desired wavelength range at the desired angle using the appropriate spectrometer
- Spectrally Resolved Measurements of Transmission, Reflectance, and Absorption (Optical Density):
- Multiple Spectrophotometers enable measurements from 190 nm – 25 microns
- Spectrophotometric Mapping System for large substrates
- Attachments for off-axis R&T Measurements including Polarization Effects
- Measurements at non-laboratory temperatures (370 to 77 Kelvin)
- Tunable lasers for extremely precise measurements in the NIR range
- Visible and NIR laser radiometers
- Surface Quality (total wavelength distortion, flatness, wedge, roughness, and pinhole density):
- Broadband Achromatic Twyman-Green Interferometer (400nm to 1.2 microns)
- Shack-Hartmann Wavefront Sensor (Total, transmitted and reflected wavefront distortion
- Autocollimator
- Integrating Sphere (total diffuse forward or backward scattering, total backward scattering)
- Angle Resolved Scatter Test Set (514.5 or 632.8 nm, s-polarized)
- Microscopy- Differential Interference Contrast (DIC) reflection, polarized reflection, oblique reflection (similar to darkfield), transmitted light
- Fiber Optic Testing at Visible and Near Infrared Wavelengths (%T or internal %R)
- Fluorescence and Autofluorescence:
- Spectrofluorimeters
- Multispectral Fluorescence Imaging
- Epifluorescence Microscopy (for evaluating filter sets- Zeiss Axioskop with Xe or Hg lamp and Spot camera)
- Environmental Testing:
- Low and High Temperature Testing (-70 – 200oC)
- Humidity Testing (20-100% RH)
- Programmable cycling
- Samples are removed and tested after Environmental Cycling
- Photovoltaic/ Semiconductor Testing:
- Kelvin Probe
- IV/CV Profiles
- Conductivity/ charge carrier concentration
ISO 9001 CERTIFICATION
ISO 9001:2015 Certificate of Registration
COMPLIANCE STATEMENTS
Explore the Features
Full Optical Capabilities
Learn more about the full suite of capabilities which are trusted by leading Global OEM’s and their Start-up challengers to deliver the right photons, to the right place, at the right time.
Measurement scale
Sub-Nanometer
- Atomic Force Microscopy
- White Light Interferometry
- Fizeau Interferometry
Nanometer to Micrometer
- Shack-Hartman Wavefront Sensor
- Ellipsometer
- Lens Center Thickness
- Contact Profilometry
- Spectrophotometers
- FT-IR
- Diffraction Grating Efficiency
Micrometer to Millimeter
- Coordinate Measuring Machine (CMM)
- Optical Microscopy
- Automated Scratch / Dig Inspection
- Pinhole Metrology
- Optical Comparator
Millimeter+
- CMM
- Cosmetic Inspection Stations
- Thermal Cycling
- Humidity Cycling
- Optical Comparator
Key Supporting Capabilities
Design & Engineering
Our commitment to finding the right solutions for difficult problems means that we are capable of doing what other engineers cannot. Some say we bend physics and solve the unsolvable. Can we? Maybe. What we know we can do is this: We ask questions and we dig, because sometimes the solutions people believe they need only scratch the surface.
Optical Coatings
Omega coating heritage dates back to 1936, and spans a wide range of technologies: Sunglasses to space-borne sun-visors; halogen light bulbs to COVID-fighting UV-C lamps, supermarket scanners to modern printers, astronomical mirrors to prestigious art installations to entertainment optics: if an application requires a precision or decorative coatings we surely have a proven solution.
Grating Manufacturing
We have the diffractive optics trifecta of multiple Ruling Engines, Holographic Mastering, and Lithographic exposure to create diffractive elements. Our in-house design and manufacturing processes provide standard or custom gratings for a range of applications, in both Original and Replicated formats.
Shaping & Polishing
We are capable to perform every lens and mirror shaping and polishing step after material synthesis. A multitude of conventional spindles combined with CNC grinding and diamond turning can fabricate virtually any curved optic.